Sophisticated Analytical Instrument Facility, AIIMS, New Delhi
Sl. |
Instrument |
Make/ |
Major Specifications/ |
Type of measurement/analysis available |
1. |
Scanning Electron Microscope |
LEO 435 VP |
Acc. voltage: 30 kV; |
SEM study as above with low vacuum and image analysis facility. |
2. |
Transmission Electron Microscope |
Philips CM 10 |
Acc. voltage: 100 kV; |
Study of the internal architecture of cells and tissues for research, diagnostic and teaching purposes. |
3. |
Transmission Electron Microscope |
FEI Philips |
Acc. voltage: 100 kV Magnification: upto |
TEM study as above with image analysis facility. |
4. |
SEM Specimen preparation a. Critical Point Dryer |
Jumbo |
Drying of biological samples. |
|
b. Sputter coater |
SCD 020 |
Metal coating of biological samples. |
||
5. |
TEM Specimen preparation
|
Ultracut E |
Ultrathin sectioning of biological samples by conventional technique & |
|
|
Ultracut UCT |
Cyrotechnique. |
||
c. Microwave oven |
Pelco |
Quick method of TEM sample processing and staining mainly used for diagnostic purposes. |