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Sophisticated Analytical Instrument Facility, AIIMS, New Delhi

Sl.
No.

Instrument

Make/
Model

Major Specifications/
Accessories available

Type of measurement/analysis available

1.

Scanning Electron Microscope

LEO 435 VP

Acc. voltage: 30 kV;
Magnification:
upto 3,00,000x;
Image analyzer system

SEM study as above with low vacuum and image analysis facility.

2.

Transmission Electron Microscope

Philips CM 10

Acc. voltage: 100 kV;
Magnification:
upto 4,50,000x;
Cryo-attachment

Study of the internal architecture of cells and tissues for research, diagnostic and teaching purposes.

3.

Transmission Electron Microscope

FEI Philips
Morgagni 268D

Acc. voltage: 100 kV Magnification: upto
2,80,000x

TEM study as above with image analysis facility.

4.

SEM Specimen preparation

a. Critical  Point Dryer

 

 

Jumbo

 

 

Drying of biological samples.

b. Sputter coater

SCD 020

Metal coating of biological samples.

5.

TEM Specimen preparation

  1.  
  2. a.Ultramicrotome

 

 

Ultracut E

 

 

Ultrathin sectioning of biological samples by conventional technique &

  1. b.Ultramicrotome

 

Ultracut UCT

Cyrotechnique.

c. Microwave oven

Pelco

Quick method of TEM sample processing and staining mainly used for diagnostic purposes.