Sl.
No.

Instrument

Make/
Model

Major Specifications/ Accessories available

Type of measurement/analysis available

1.

X-ray Diffractometer (powder)

Philips X’pert Pro

Fully automated computerized powder XRD; X-ray tube: Cu;
Angular range (2θ): 20 to 1470;
High temperature attachment (range upto 1600 0 C);
Thin film attachment;
ICDD database with PDF-1 & PDF-2

2θ vs intensity plots/X-ray diffractograms; Quantitative analysis and other studies including phase identification, unit cell parameter determination, particle size  determination etc.

2.

X-ray Fluorescence Spectrometer

Philips
PW 1480

Computerized sequential XRF with 3 KW side window X-ray tubes (Rh & Cr-Au);    
Analysing Crystals- LiF200, LiF220, TLAP, PE, GE, PX1, PX2; Pulveriser; Hydraulic press; Fused bead making   accessories; Muffle furnace etc.  

Qualitative detection of elements from F9 to U92;
Qualitative/quantitative analysis of silicate rocks and minerals,  clays, limestone, cement etc. for major and minor oxides and traces.

3.

X-ray Fluorescence Spectrometer

PANalytical AXIOS

Computerized sequential XRF with 4 KW, Rh end window ceramic X-ray tube. Analysing crystals LiF 220, LiF 200, GE, PE, PX-1; Pro-trace software and set of standards for trace element analysis in Geological samples.

Qualitative detection of elements from O8
 to  U92; Qualitative/quantitative analysis of  silicate rocks and minerals,  clays, limestone, cement etc. for major and minor oxides and traces.