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EPMA Facility, Indian Institute of Technology, Roorkee

 

Sl.
No.

Instrument

Make/
Model

Major  Specifications/
Accessories available

Type of measurement/analysis available

1.

Electron Probe Micro Analyser

JEOL, JXA 8600 M Super Probe

3-Channel wavelength dispersive spectrometer  for analyzing elements; 
Acc. voltage: 0.5 to  50 kV; Probe diameter: 0 to 300 μm;
Objective Aperture:
70, 130, 170 & 240 μm;
B.S. detection, X-ray mapping accessories and software for analysis

Qualitative   and    quantitative    analysis
including trace element concentration analysis;  Detectable  elements  B5 to U92; 3D map analysis;  Chemical shift analysis;  Spectrum deconvolution;  Area map analysis.